How many readings should be taken for XRF substrate correction?

Taking six readings for XRF substrate correction is important because it helps ensure statistical reliability and accuracy in the measurements. The methodology for substrate correction in X-ray fluorescence (XRF) analysis often employs multiple readings to account for any variations in the substrate or material being tested.

By collecting six readings, the data obtained can be averaged to minimize the impact of outliers or anomalous values that could skew the results. This practice allows for a more robust correction for any potential interference from the substrate, leading to more precise quantification of the elements present in the sample. Generally, a minimum of three readings is often a standard practice; however, increasing the number to six provides a greater degree of confidence in the substrate correction process, thereby enhancing the overall quality of the analytical results.